Genetic Algorithm for Test Pattern Generator Design

T. Garbolino, G. Papa
Applied Intelligence, 2010, Vol. 32, No. 2, pages: 193-204

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BibTex:
@ARTICLE{GarbolinoPapaAPIN2010,
AUTHOR = {Tomasz Garbolino and Gregor Papa},
TITLE = {Genetic Algorithm for Test Pattern Generator Design},
JOURNAL = {Applied Intelligence},
YEAR = {2010},
volume = {32},
number = {2},
pages = {193-204},
month = {April},
}

abstract:
The paper describes an approach for the generation of a deterministic test pattern generator logic, which is composed of D-type and T-type flip-flops. This approach employs a genetic algorithm that searches for an acceptable practical solution in a large space of possible implementations. In contrast to conventional approaches the proposed one reduces the gate count of a built-in self-test structure by concurrent optimization of multiple parameters that influence the final solution. The optimization includes the search for: the optimal combination of register cells type; the presence of inverters at inputs and outputs; the test patterns order in the generated test sequence; and the bit order of test patterns. Results of benchmark experiments and comparison with similar studies demonstrate the efficiency of the proposed evolutionary approach.