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Franc Novak

Contact information

Address: Jozef Stefan Institute, Computer Systems Dept., Jamova 39, 1000 Ljubljana, Slovenia
Phone: +386 1 4773 386
Fax: +386 1 2519 385

Biographical sketch

Relevant publications in electronic design and test


M. Santo Zarnik, D. Belavic, F. Novak: The Impact of Housing on the Characteristics of Ceramic Pressure Sensors—An Issue of Design for Manufacturability, Sensors, 2015, vol. 15, no. 12, pp. 31453–31463, (abstract)

U. Kac, F. Novak: Practical considerations in oscillation based test of SC biquad filters, Information technology and control, 2014, vol. 43, no. 1, pp. 28-36, (abstract)

A. Biasizzo, F. Novak: Hardware Accelerated Compression of LIDAR Data Using FPGA Devices, Sensors, 2013, vol. 13, no. 5, pp. 6405-6422, (abstract)

U. Kac, F. Novak: Reconfiguration schemes of SC biquad filters for oscillation based test, Information technology and control, 2013, vol. 42, no. 1, pp. 38-47, (abstract)

U. Legat, A. Biasizzo, F. Novak: SEU recovery mechanism for SRAM-based FPGAs, IEEE Transactions on Nuclear Science, 2012, vol. 59, no. 5, pp. 2562-2571. (abstract)

M. Pavlin, D. Belavic, F. Novak: Ceramic MEMS designed for wireless pressure monitoring in the industrial environment, Sensors, 2012, vol. 12, no. 1, pp. 320-333, (abstract)

M. Pavlin, F. Novak: A wireless interface for replacing the cables in bridge-sensor applications, Sensors, 2012, vol. 12, no. 8, pp. 10014-10033, (abstract)

U. Legat, A. Biasizzo, F. Novak: On-line self-recovery of embedded multi-processor SOC on FPGA using dynamic partial reconfiguration, Information technology and control, 2012, vol. 41, no. 2, str. 116-124, (abstract)

F. Novak, P. Mrak, A. Biasizzo: Test strategies for embedded ADC cores in a system-on-chip : a case study, Computing and Informatics, 2012, vol. 31, no. 2, str. 411-426, (abstract)

U. Legat, A. Biasizzo, F. Novak: A compact AES core with on-line error-detection for FPGA applications with modest hardware resources, Microprocessors and microsystems, 2011, vol. 35, No. 4, pp. 405-416. (abstract)

R. Pacnik, F. Novak: A high-sensitivity hydraulic load cell for small kitchen appliances, Sensors, Vol. 10, No. 9, 2010, pp. 8452-8465. (abstract)

P. Mrak, A. Biasizzo, F. Novak: Measurement accuracy of oscillation-based test of analog-to-digital converters, ETRI Journal, Vol. 32, No. 1, 2010, pp. 154-156. (abstract)

M. Wegrzyn, F. Novak, A. Biasizzo, M. Renovell: Functional testing of processor cores in FPGA-based applications, Computing and Informatics, Vol. 28, No. 1, 2009, pp. 97-113. (abstract)

M. Pavlin, F. Novak: Yield enhancement of piezoresistive pressure sensors for automotive applications, Sensors and Actuators A: Physical, Vol. 141, Issue 1, 2008, pp. 34-42. (abstract)

U. Kac, F. Novak: Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration, Journal of Electronic Testing: Theory and Applications, Vol. 23, No. 6, 2007, pp. 485-495. (abstract)

F. Novak et al.: Academic network for microelectronic test education, International Journal on Engineering Education, Vol. 23, No. 6, 2007, pp. 1245-1253. (abstract)

M. Santo Zarnik, D. Belavic, F. Novak: Finite-element model-based fault diagnosis, a case study of a ceramic pressure sensor structure, Microelectronics Reliability, Vol. 47, Issue 12, 2007, pp. 1950-1957. (abstract)

G. Papa, T. Garbolino, F. Novak, A. Hlawiczka: Deterministic test pattern generator design with genetic algorithm approach, Journal of Electrical Engineering, Vol. 58, No. 3, 2007, pp. 121-127. (abstract)

F. Novak, A. Biasizzo: Security extension for IEEE Std 1149.1, Journal of Electronic Testing: Theory and Applications, Vol. 22, 2006, pp. 301-303. (abstract)

M. Mali, F. Novak, M. A. Biasizzo: Hardware implementation of AES algorithm, Journal of Electrotechnical Engineering, Vol. 56, No. 9-10, 2005, pp. 265-269. (abstract)

F. Novak, M. Santo Zarnik, S. Macek: Early warning of fault conditions of an over-current protection module in dependable communication applications, Reliability Engineering and System Safety, Vol. 84, No. 2, 2004, pp. 125-128. (abstract)

U. Kac, F. Novak, F. Azais, P. Nouet, M. Renovell: Extending IEEE Std. 1149.4 analog boundary modules to enhance mixed-signal test, IEEE Design & Test of Computers, Vol. 20, No. 2, 2003, pp. 32-39. (abstract)

F. Novak, M. Santo Zarnik: Thermal testing using oscillation based test structures, Electronics Letters, Vol. 39, No. 2, 2003, pp. 174-175. (abstract)

F. Novak, M. Santo Zarnik, U. Kac: Stimulus generation of a built-in-self-test using oscillation based test structures, International Journal of Electronics, Vol. 89, No. 11, 2002, pp. 811-820. (abstract)

U. Kac, R. Sedevcic, F. Novak and A. Biasizzo: Linux-based experimental boundary scan environment. Microprocessors and Microsystems, Vol. 26, Issue. 5, 2002, pp. 199-206. (abstract)

M. Khalil, C. Robach, F. Novak: Diagnosis strategies for hardware or software systems. J. Electronic Testing: Theory and Applications, Vol. 18, Issue. 2, 2002, pp. 241-251. (abstract)

M.Santo Zarnik, F. Novak: On oscillation-based test structures of active RC filters. International Journal of Numerical Modelling, Electronic networks, Devices and Fields, Vol. 14, Issue. 3, 2001, pp. 283-288. (abstract)

M.Santo Zarnik, F.Novak, S.Macek: Design of oscillation-based test structures for active RC filters. IEE Proc, Circuits, Devices and Systems, Vol. 147, No. 5, October 2000, pp. 297-302. (abstract)

A.Zuzek, A.Biasizzo, F.Novak: Sequential diagnosis tool. Microprocessors and microsystems, Vol. 26, (2000) pp. 191-197. (abstract)

A.Biasizzo, F.Novak: On the diagnosing algorithm for networks. International Journal of Computer Mathematics, Vol. 74, pp. 1-3. (abstract)

A.Biasizzo, F.Novak: A methodology for model-based diagnosis of analog circuits. Applied Artificial Intelligence, Vol. 14, pp. 253-269. (abstract)

A.Biasizzo, A.Zuzek, F.Novak: Enhanced sequential diagnosis. Research Perspectives and Case Studies in System Test and Diagnosis, (chapter in the book), Kluwer Academic Publishers, ed. John W. Sheppard, William R. Simpson, 1998, ISBN: 0-7923-8263-3.

A.Biasizzo, A.Zuzek, F.Novak: Sequential diagnosis with asymmetrical tests. The Computer Journal, Vol. 41, No. 3, 1998, pp. 163-170. (abstract)

M.Santo Zarnik, F.Novak, S.Macek: Efficient go no-go test of active RC filters. Int. Journal of circuit theory and applications, Vol. 26, 1998, pp. 523-529. (abstract)

M.Santo Zarnik, F.Novak, S.Macek: Design for test of crystal oscillators. Journal of Electronic Testing, Vol. 11, No. 2, 1997, pp. 109-117. (abstract)

B.Hvala, S.Klavzar, F.Novak: On Y-compatible and strict Y-compatible functions. Applied Mathematics Letters, Vol. 10, No. 1, 1997, pp. 79-82 (abstract)

F.Novak, N.Sutanovac, R.Trobec: Built-in self testing of communications systems using ASIC technology. Microprocessors and Microsystems, 17(8):475-480, 1993. (abstract)

F.Novak, S.Klavzar: An algorithm for identification of maliciously faulty units. Int'l J. Computer Mathematics, 48:21-29, 1993. (abstract)

F.Novak, I.Mozetic, M.Santo-Zarnik, A.Biasizzo: Enhancing design-for-test for active analog filters using CLP(R). Analog Integrated Circuits and Signal Processing, 4:215-229, 1993. (abstract)

F.Novak, I.Mozetic, M.Santo-Zarnik, A.Biasizzo: Enhancing design-for-test for active analog filters using CLP(R). J. Electronic Testing: Theory and Applications, 4(4):315-329, 1993. (abstract)

F.Novak: Enhancing signature analysis troubleshooting. Electronic Engineering, pp.25-26, July 1990. (abstract)

F.Novak, S.Klavzar, L.Gyergyek: On system diagnosis for transient fault situations. Microprocessing and Microprogramming, 22:273-275, 1988. (abstract)

A. Dobrin, F. Novak: Freerunning the M68000. Electronics Test, pp.124, April 1984. (abstract)


P.Mrak, A.Biasizzo, F.Novak: Implementation of linear histogram based ADC testing, a case study. Informal digest of papers, 13th IEEE European Test Symposium, ETS'08, pp. 223-227, Verbania, Italy, May 25-29, 2008. (abstract)

F.Novak, A.Biasizzo: Implementation of security extension for IEEE Std. 1149.1 and analysis of possible attack scenarios. Informal digest of papers, 12th IEEE European Test Symposium, ETS'07, pp. 223-227, Freiburg, Germany, May 20-24, 2007. (abstract)

A.Biasizzo, F.Novak: An approach to testing mixed-signal cores in SOCs. Proc. 4th European Microelectronics and Packaging Symposium, EMPS 2006, pp. 223-227, Terme Catez, Slovenia, May 21-24, 2006. (abstract)

M.Santo-Zarnik, D.Belavic, S.Macek, F.Novak: Fault diagnosis based of a finite-element model of a piezoresistive ceramic pressure sensor. Proc. 11th Int. Mixed-Signals Testing Workshop, IMSTW'05, pp. 171-178, Cannes, France, June 27-29, 2005. (abstract)

U.Kac, F.Novak: All-pass SC biquand reconfiguration scheme for oscillation based analog BIST. Proc. 9th IEEE European Test Symposium, ETS 2004, pp. 133-138, Ajaccio, France, May 23-26, 2004. (abstract)

U.Kac, F.Novak: Experimental test infrastructure supporting IEEE 1149.4 standard. Proc. 7th IEEE European Test Workshop , pp. 211-212, Corfu, Greece, May 26-29, 2002. (abstract)

U.Kac, F.Novak, F.Azais, P.Nouet, M.Renovell: Implementation of an experimental IEEE 1149.4 mixed-signal test chip. Proc. 1st IEEE International Board Test Workshop, BTW02, Baltimore, USA, October 10-11, 2002. (abstract)

M.Khalil, C.Robach, F.Novak, A.Zuzek: System level diagnosis - a comparison of two alternative approaches. Proc. 6th IEEE European Test Workshop 2001, pp. 89-95, Stockholm, May 29 - June 1, 2001. (abstract)

U.Kac, F.Novak, S.Macek, M.Santo Zarnik: Alternative test methods using IEEE 1149.4 Proc. Design, Automation and Test in Europe Conferece, DATE 2000, pp. 463-467, Paris, March 27-30, 2000. (abstract)

F.Novak, B.Hvala, S.Klavzar: On analog signature analysis. Proc. Design, Automation and Test in Europe Conference, DATE'99, pp. 249-253, Munich, March 9-12, 1999. (abstract)

M.Santo Zarnik, F.Novak, S.Macek: Feasibility study of oscillation based test structures of active RC filters with built-in test switches. Proc. 4th Int. Mixed-Signal Testing Workshop, pp. 129-134, The Hague, June 8-11, 1998. (abstract)

A.Biasizzo, A.Zuzek, F.Novak: Sequential diagnosis tool. Proc. IEEE Int. Workshop on System Test and Diagnosis (IWSTD'98), pp. 3-12, Alexandria, Virginia, April 7-9, 1998. (abstract)

F.Novak, A.Biasizzo, A.Zuzek (Jozef Stefan Institute, Ljubljana), P.Helm, M.Bachler, M.Grottke(WIP, Renewable Energies Division, Munich): Real time diagnostic monitoring of Brunnenbach PV plant. Proc. 2nd ISES-Europe Solar Congress EuroSun 98, (abstract)

M.Santo Zarnik, F.Novak. S.Macek: Oscillation test structures of active RC filters. Proc. IEE Colloquium on Testing mixed signal circuits and systems, pp. 4/1-4/6, London, 23 October 1997. (abstract)

M.Santo Zarnik, F.Novak, S.Macek: Design of oscillation-based test structures for active RC filters. Proc. of European Design & Test Conference 97, 17 - 20 March, 1997. (abstract)

F.Mohamed, M.Marzouki, A.Biasizzo, F.Novak: Analog circuit simulation and troubleshooting with FLAMES. Proc. of 14th IEEE VLSI Test Symposium, pp.495-502, Princeton, New Jersey, April 28 - May 1, 1996. (abstract)

M.Santo Zarnik, F.Novak. S.Macek: A practical approach to fault localization in crystal oscillators. Proc. of IEEE European Test Workshop, pp.89-93, Montpellier, France, June 12-14, 1996. (abstract)

A.Zuzek, A.Biasizzo, F.Novak: Toward a general test presentation in the test sequencing problem. Proc. of 2nd IEEE International On-Line Testing Workshop, pp.236-237, Biarritz, France, 1996, IEEE Computer Society Press. (abstract)

A.Biasizzo, F.Novak: Model-based diagnosis of analog circuits with CLP(R). Proc. Int'l Mixed Signal Testing Workshop, pp.95-100, Grenoble, France, 1995. (abstract)

M.Santo-Zarnik, M.Pavsek-Taskov, F.Novak, S.Macek: DFT of Pierce crystal oscillator - A case study. Proc. Int'l Mixed Signal Testing Workshop, pp.118-123, Grenoble, France, 1995. (abstract)

R.Trobec, F.Novak, D.S.Prodan: Design of asynchronous digital multiplex unit - ASIC implementation considerations. Proc. EDAC-ETC-EUROASIC 1994 - User Forum, pp.7-11, Paris, France, 1994. (abstract)

I.Mozetic, F.Novak, M.Santo-Zarnik, A.Biasizzo: Diagnosing analog circuits designed-for-testability by using CLP(R). Proc. 4th Int'l Workshop on Principles of Diagnosis, pp.105-120, Aberystwyth, UK, 1993. (abstract)

F.Novak, A.Biasizzo, M.Santo-Zarnik, I.Mozetic: On automatic fault isolation using DFT methodology for active analog filters. Proc. 3rd European Test Conference 93, pp.534-535, Rotterdam, The Netherland, 1993, IEEE Computer Society Press. (abstract)

I.Mozetic, C.Holzbaur, F.Novak, M.Santo-Zarnik: Model-based analogue circuit diagnosis with CLP(R). Proc. 4th Int'l GI-Conf., pp.343-353, Munich, Germany, 1990, Springer-Verlag. (abstract)

Collaboration with Faculty of Electrical Engineering and Computer Science University of Maribor

D. Spelic, F. Novak, B. Zalik : A Fast Method for the Alignment of the Displacement of Voxel Data, Advances in Electrical and Computer Engineering , Vol. 12, No. 2, 2009, pp. 41-46.

D. Spelic, F. Novak, B. Zalik : Educational support for computational geometry course - the Delaunay triangulation tester, International Journal of Engineering Education , Vol. 25, No. 1, 2009, pp. 93-101.

D. Spelic, F. Novak, B. Zalik : Delaunay triangulation benchmarks, Journal of Electrical Engineering , Vol. 59, No. 1, 2008, pp. 49-52.

G. Klajnsek, B. Zalik, F. Novak, G. Papa : A quadtree-based progressive lossless compression technique for volumetric data sets, Journal of Information Science and Engineering , Vol. 24, No. 4, 2008, pp. 1187-1195.

B. Kaucic, B. Zalik, F. Novak: On the lower bound of edge guards of polyhedral terrains, International Journal of Computer Mathematics , Vol. 80, No. 7, 2003, pp. 811-814.

S. Krivograd, B. Zalik, F. Novak: TriMeDeC tool for preparing visual teaching materials based on triangular networks, Computer Applications in Engineering Education , Vol. 10, 2002, pp. 144-154.

S. Krivograd, B. Zalik, F. Novak: Triangular mesh decimation and undecimation for engineering data modelling, Inf. MIDEM , Vol. 32, No. 3, 2002, pp. 219-223.

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