Anton Biasizzo

Contact information

Office:

Address: Jozef Stefan Institute, Computer Systems Dept., Jamova 39, 61111 Ljubljana, Slovenia

Phone: +386 61 1773 297

Fax: +386 61 219 385

Email: anton.biasizzo@ijs.si

Home:

Address: Nanoska ul. 28, 61111 Ljubljana, Slovenia

Biographical sketch

• born February 27, 1967, Postojna, Slovenia
• B.Sc. in Electrical Engineering, Univ. Ljubljana, Slovenia, 1991
• M.Sc. in Electrical Engineering, Univ. Ljubljana, Slovenia, 1995
• Ph.D. in Electrical Engineering, Univ. Ljubljana, Slovenia, 1998
• research assistant, J.Stefan Institute, Ljubljana, Slovenia, since 1998

Areas of research

• testing and diagnostics
• diagnostic based on CLP(R)
• CAD

Relevant publications

A.Biasizzo, A.Zuzek, F.Novak: Sequential diagnosis with asymmetrical tests. The Computer Journal, Vol. 41, No. 3, 1998, pp. 163-170. (abstract)

A.Biasizzo, A.Zuzek, F.Novak: Sequential diagnosis tool. Proc. IEEE Int. Workshop on System Test and Diagnosis (IWSTD'98), pp. 3-12, Alexandria, Virginia, April 7-9, 1998. (abstract)

F.Novak, A.Biasizzo, A.Zuzek (Jozef Stefan Institute, Ljubljana), P.Helm, M.Bachler, M.Grottke(WIP, Renewable Energies Division, Munich): Real time diagnostic monitoring of Brunnenbach PV plant. Proc. 2nd ISES-Europe Solar Congress EuroSun 98, (in print) (abstract)

F.Mohamed, M.Marzouki, A.Biasizzo, F.Novak. Analog circuit simulation and troubleshooting with FLAMES. Proc. of 14th IEEE VLSI Test Symposium, pp.495-502, Princeton, New Jersey, April 28 - May 1, 1996. (abstract)

A.Zuzek, A.Biasizzo, F.Novak. Toward a general test presentation in the test sequencing problem. Proc. of 2nd IEEE International On-Line Testing Workshop, pp.236-237, Biarritz, France, 1996, IEEE Computer Society Press. (abstract)

Anton Biasizzo, Franc Novak. A methodology for model-based diagnosis of analog circuits. Proc. CESA'96 IMACS Multiconference, Symposium on Modelling, Analysis and Simulation, pp. 344-349, Lille, France, July 9-12, 1996. (abstract)

A.Biasizzo, F.Novak. Model-based diagnosis of analog circuits with CLP(R). Proc. Int'l Mixed Signal Testing Workshop, pp.95-100, Grenoble, France, 1995. (abstract)

F.Mohamed, M.Marzouki, F.Novak, A.Biasizzo. A fuzzy logic approach for analog circuit diagnosis. Proc. Int'l Mixed Signal Testing Workshop, pp.101-106, Grenoble, France, 1995. (abstract)

A.Zuzek, A.Biasizzo, F.Novak, I.Savnik. Experimental environment for sequential diagnosis. Proc. Electronic Devices and Systems Conf., pp.42-45, Brno, Czech Republic, 1995. (abstract)

A.Zuzek, F.Novak, A.Biasizzo, I.Savnik, B.Cestnik. Sequential diagnosis tool for system maintenance and repair. Electrotechnical Review 62(3-4):224-231, 1995. (abstract)

F.Novak, I.Mozetic, M.Santo-Zarnik, A.Biasizzo. Enhancing design-for-test for active analog filters using CLP(R). Analog Integrated Circuits and Signal Processing, 4:215-229, 1993. (abstract)

F.Novak, I.Mozetic, M.Santo-Zarnik, A.Biasizzo. Enhancing design-for-test for active analog filters using CLP(R). J. Electronic Testing: Theory and Applications, 4(4):315-329, 1993. (abstract)

I.Mozetic, F.Novak, M.Santo-Zarnik, A.Biasizzo. Diagnosing analog circuits designed-for-testability by using CLP(R). Proc. 4th Int'l Workshop on Principles of Diagnosis, pp.105-120, Aberystwyth, UK, 1993. (abstract)

F.Novak, A.Biasizzo, M.Zele. Sequential fault diagnosis in system maintenance. Proc. 7th Annual European Computer Conf. CompEuro 93, pp.119-124, Paris, France, 1993, IEEE Computer Society Press. (abstract)

F.Novak, A.Biasizzo, M.Santo-Zarnik, I.Mozetic. On automatic fault isolation using DFT methodology for active analog filters. Proc. 3rd European Test Conference 93, pp.534-535, Rotterdam, The Netherland, 1993, IEEE Computer Society Press. (abstract)