On design of a low-area deterministic test pattern generator by the use of genetic algorithm
Authors
T. Garbolino,
A. Hlawiczka,
G. Papa, F. Novak
Publication
VIIIth International Conference on The experience of designing and application of CAD systems in Microelectronics CADSM2005
Lviv, Ukraine, 23-26 February, 2005
Abstract
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