Academic Network for Microelectronic Test Education
F. Novak, A. Biasizzo, Y. Bertrand, M-L. Flottes, L. Balado, J. Figueras, S. Di Carlo, P. Prinetto, N. Pricopi, H-J. Wunderlich, J-P. Van der Hayden
International Journal of Engineering Education, 2007
This paper is an overview of the activities performed in the framework of the European IST project EuNICE-Test (European Network for Initial and Continuing Education in VLSI/SOC Testing using remote automatic test equipment (ATE)), addressing the shortage of skills in the microelectronics industry in the field of electronic test. The project was based on the experience of common test resource centre (CRTC) for French universities. In the framework of EuNICE-Test project, the existing network expanded to 4 new academic centres: Universitat Politècnica de Catalunya, Spain, Politecnico di Torino, Italy, University Stuttgart, Germany and Jožef Stefan Institute Ljubljana, Slovenia. Assessments of the results achieved are presented as well as course topics and possible future extensions.
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