Deterministic Test Pattern Generator Design
G. Papa, T. Garbolino, F. Novak
European Workshops on the Theory and Applications of Evolutionary Computation EvoHOT 2008
Naples, Italy, 26-28 March, 2008
This paper presents a deterministic test pattern generator structure design based on genetic algorithm. The test pattern generator is composed of a linear register and a non-linear combinational function. This is very suitable solution for on-line built-in self-test implementations where functional units are tested in their idle cycles. In contrast to conventional approaches our multi-objective approach reduces the gate count of built-in self-test structure by concurrent optimization of multiple parameters that influence the final solution.
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